The ZEISS EVO MA10 is a high-resolution scanning electron microscope (SEM). It is used in different fields of application especially in materials science. This instrument allows to analyse samples of massive material or with coatings, fractures on small components (failure analysis). Moreover, it provides the study of engineered materials, such as alloys, coatings and multi-layer nanostructures. It is possible to obtain topographic information from the samples thanks to the high-vacuum secondary electron detector, as well as compositional information thanks to the high- and low-vacuum backscattered electron detector. The ZEISS EVO MA10 is able to work both at high vacuum and at variable pressure, thus allowing the analysis of all conductive or non-conductive materials. It also features a Bruker QUANTAX 200, a microanalysis system based on energy dispersion spectroscopy (EDS) that provides the qualitative and semi-quantitative compositional data of the samples to be studied. It is also possible to perform chemical analysis on profiles to determine compositional gradients, or mapping elements on two-dimensional images, useful for associating phases and composition.
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