Nanovea PS50 is a contact-less profilometer, suitable to scan profiles and areas of a surface by correlation of a x-y position of a moving sample table, with a z reading of a chromatic confocal sensor. Chromatic confocal technique uses white light filtered through a series of lenses with high degree of chromatic aberration. As a result, different wavelengths focus at different distances, creating a vertical measurement range.
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